- Manufacture :
- Series :
- Part Status :
- Packaging :
- Mounting Type :
- Supplier Device Package :
- Supply Voltage :
- Logic Type :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (5)
- Buffer/Driver with Parity (3)
- Scan Test Device with Buffers (5)
- Scan Test Device with Bus Transceivers (4)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (6)
- Scan Test Device with D-Type Latches (5)
- Scan Test Device with Inverting Buffers (6)
- Schottky Barrier Diode Bus-Termination Array (3)
- TTL/BTL Registered Transceiver (6)
- TTL/BTL Transceiver/Translator (4)
- Applied Filters :
48 results
| Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | |||||||||||||||||
|
RFQ |
2,160
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-DIP | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
RFQ |
3,983
In-stock
|
Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
RFQ |
1,746
In-stock
|
Texas Instruments | IC 8-BIT TTL/BTL XCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | |||
|
|
RFQ |
2,093
In-stock
|
Texas Instruments | IC 8-BIT TTL/BTL REG XCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
RFQ |
3,648
In-stock
|
Texas Instruments | IC 8-BIT TXCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
RFQ |
1,319
In-stock
|
ON Semiconductor | GPIB COMPATIBLE OCTAL TRANSCEIV | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 8 | - | |||
|
RFQ |
1,582
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
RFQ |
1,743
In-stock
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
3,509
In-stock
|
Texas Instruments | IC TXRX 8BIT TTL/BTL 52-QFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | ||||
|
|
3,029
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||||
|
|
2,371
In-stock
|
Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 74FB | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | ||||
|
|
972
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
|
|
2,187
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||||
|
|
3,168
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
|
|
2,497
In-stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||||
|
1,391
In-stock
|
Texas Instruments | IC SCHOTTKY BARRIER DIODE 16SOIC | 74F | Active | Tube | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
|
|
2,588
In-stock
|
Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 74F | Active | Tube | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
|
|
3,829
In-stock
|
Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 74F | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
|
|
RFQ |
1,666
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
1,188
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
3,317
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
3,250
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
806
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
2,454
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
3,808
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
846
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
|
RFQ |
3,810
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
|
RFQ |
2,817
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
|
RFQ |
2,739
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
|
RFQ |
1,959
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Discontinued at Digi-Key | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
