- Manufacture :
- Operating Temperature :
- Mounting Type :
- Supplier Device Package :
- Logic Type :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (1)
- Embedded Test-Bus Controllers (6)
- IEEE STD 1284 Translation Transceiver (3)
- LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver (4)
- Programmable Terminator (2)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceiver and Registers (7)
- Scan Test Device with Bus Transceivers (7)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (1)
- Scan Test Device with D-Type Latches (1)
- Scan Test Device with Inverting Buffers (1)
- Scan Test Device with Registered Bus Transceiver (2)
- Schottky Barrier Diode Bus-Termination Array (3)
- TTL/BTL Registered Transceiver (1)
- TTL/BTL Transceiver/Translator (1)
- Applied Filters :
42 results
| Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | |||||||||||||||||
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3,509
In-stock
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Texas Instruments | IC TXRX 8BIT TTL/BTL 52-QFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | ||||
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1,519
In-stock
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Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||||
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2,912
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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3,029
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||||
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2,371
In-stock
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Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 74FB | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | ||||
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972
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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2,644
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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2,187
In-stock
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||||
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2,307
In-stock
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Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||||
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2,015
In-stock
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Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||||
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3,343
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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3,168
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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2,054
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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2,497
In-stock
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||||
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1,391
In-stock
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Texas Instruments | IC SCHOTTKY BARRIER DIODE 16SOIC | 74F | Active | Tube | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
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2,588
In-stock
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Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 74F | Active | Tube | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
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3,829
In-stock
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Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 74F | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
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3,187
In-stock
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Texas Instruments | IC TERMINATOR PROG DUAL 14-DIP | 4000B | Active | Tube | -55°C ~ 125°C | Through Hole | 14-DIP (0.300", 7.62mm) | 14-PDIP | 3 V ~ 18 V | 8 | Programmable Terminator | ||||
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RFQ |
1,328
In-stock
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Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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1,328
In-stock
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Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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2,704
In-stock
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Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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2,394
In-stock
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Texas Instruments | IC TERMINATOR PROG DUAL 14-DIP | 4000B | Active | Tube | -55°C ~ 125°C | Through Hole | 14-DIP (0.300", 7.62mm) | 14-PDIP | 3 V ~ 18 V | 8 | Programmable Terminator | ||||
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3,543
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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962
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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889
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||||
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2,326
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||||
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1,363
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||||
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RFQ |
1,132
In-stock
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ON Semiconductor | TXRX TRANSLATING IEEE 48TSSOP | 74LVX | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 3 V ~ 3.6 V | 8 | IEEE STD 1284 Translation Transceiver | |||
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2,829
In-stock
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ON Semiconductor | TXRX TRANSLATING IEEE 48TSSOP | 74LVX | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 3 V ~ 3.6 V | 8 | IEEE STD 1284 Translation Transceiver | ||||
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2,927
In-stock
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ON Semiconductor | TXRX TRANSLATING IEEE 48TSSOP | 74LVX | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 3 V ~ 3.6 V | 8 | IEEE STD 1284 Translation Transceiver | ||||
