- Manufacture :
- Operating Temperature :
- Mounting Type :
- Package / Case :
-
- 14-SOIC (0.154", 3.90mm Width) (7)
- 14-SOIC (0.209", 5.30mm Width) (3)
- 14-TSSOP (0.173", 4.40mm Width) (6)
- 16-DIP (0.300", 7.62mm) (1)
- 24-DIP (0.300", 7.62mm) (11)
- 24-SOIC (0.295", 7.50mm Width) (14)
- 28-BSSOP (0.295", 7.50mm Width) (6)
- 28-SOIC (0.295", 7.50mm Width) (13)
- 48-BSSOP (0.295", 7.50mm Width) (5)
- 48-TFSOP (0.173", 4.40mm Width) (20)
- 48-TFSOP (0.240", 6.10mm Width) (16)
- 52-QFP (7)
- 56-VFBGA (16)
- Logic Type :
-
- - (1)
- 8-Bit to 9-Bit Parity Bus Transceiver (4)
- Buffer/Driver with Parity (3)
- IEEE STD 1284 Translation Transceiver (11)
- LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver (46)
- Programmable Terminator (16)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceiver and Registers (8)
- Scan Test Device with Bus Transceivers (2)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (5)
- Scan Test Device with D-Type Latches (4)
- Scan Test Device with Inverting Buffers (5)
- Scan Test Device with Registered Bus Transceiver (11)
- TTL/BTL Registered Transceiver (5)
- TTL/BTL Transceiver/Translator (2)
- Applied Filters :
125 results
| Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | |||||||||||||||||
|
RFQ |
2,160
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-DIP | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
RFQ |
2,037
In-stock
|
ON Semiconductor | TXRX BIDIRECT IEEE 48TSSOP | 74VHC | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 4.5 V ~ 5.5 V | 8 | IEEE STD 1284 Translation Transceiver | |||
|
|
RFQ |
3,709
In-stock
|
ON Semiconductor | TXRX BIDIRECT IEEE 48TSSOP | 74VHC | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 4.5 V ~ 5.5 V | 8 | IEEE STD 1284 Translation Transceiver | |||
|
|
RFQ |
1,801
In-stock
|
ON Semiconductor | TXRX BIDIRECT IEEE 48TSSOP | 74VHC | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 4.5 V ~ 5.5 V | 8 | IEEE STD 1284 Translation Transceiver | |||
|
RFQ |
3,665
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
|
RFQ |
1,958
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
|
RFQ |
3,125
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
RFQ |
3,983
In-stock
|
Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
RFQ |
1,746
In-stock
|
Texas Instruments | IC 8-BIT TTL/BTL XCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | |||
|
|
RFQ |
2,093
In-stock
|
Texas Instruments | IC 8-BIT TTL/BTL REG XCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
RFQ |
3,648
In-stock
|
Texas Instruments | IC 8-BIT TXCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
RFQ |
1,319
In-stock
|
ON Semiconductor | GPIB COMPATIBLE OCTAL TRANSCEIV | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 8 | - | |||
|
RFQ |
1,582
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
RFQ |
1,743
In-stock
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
RFQ |
1,666
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
1,188
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
3,317
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
3,250
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
806
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
2,454
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
3,808
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
846
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
|
RFQ |
3,810
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
|
RFQ |
2,817
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
|
RFQ |
2,739
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
|
RFQ |
3,609
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
RFQ |
2,795
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
RFQ |
2,312
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
RFQ |
3,215
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
RFQ |
3,663
In-stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
